Intel DC P4510 8TB NVMe Enterprise SSD Review

Intel DC P4510 8TB NVMe Enterprise SSD Review

SNIA Write Saturation Test

This test performs random 4K writes at a Queue Depth of 32.

The objective of this test is to observe the time evolution of
the drive’s performance, as a function of time, from a ‘factory fresh’, ‘fresh
out of the box’ (‘FOB’) state.  When a drive is in a FOB state (e.g. after it
has been purged by, for example an SATA Secure Erase or SCSI Format), we can
expect an initial period of time when writes can easily be accommodated by
clean/empty blocks, but once all of the clean blocks have been written to once
and the drive’s controller must first clean blocks (with erase write
operations) before it can write new data, then we can expect a slow down.  The
slow-down is usually quite dramatic and is commonly referred to as the ‘write
cliff’. 

The Write Saturation Test is
easy to run as it requires no steady state determination.

Here are the results –

Intel DC P4510 8TB NVMe Enterprise SSD Review

 

You can see a typical ‘write cliff’ occurs at around Round 58
after which the drive’s performance falls gradually towards a Steady State. 

Note that the test was halted, as specified in the SNIA Solid
Storage Solutions PTS, when 4 x the User Capacity had been written to the drive.
  

 

Intel DC P4510 8TB NVMe Enterprise SSD Review

You can also see that the latency graph line is a mirror
image of the IOPS graph line.

 

Now let’s head to the next page, to look at the SNIA
Throughput Test…..